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Electronic failure analysis handbook : techniques and applications for electronic and electrical packages, components, and assemblies /

"In the Electronic Failure Analysis Handbook, you'll find top-to-bottom coverage of this rapidly developing field, encompassing breakthrough techniques and technologies for both components and systems reliability testing, performance evaluation, and liability avoidance."--Jacket.

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Prif Awdur: Martin, Perry L., (Awdur)
Awduron Eraill: Dylls, D. David., Medora, Noshirwan K., Le May, Ian., Ludwig, Lawrence L., Kaplan, Herbert., Kessler, L. W., Semmens, J. E., Roche, David J., Erickson, J. J., Devaney, John R., Van Westerhuyzen, Dennis H., Vettraino, L. G., Blanchard, Richard A., Galler, Donald., Glover, Duncan., Kusko, Alexander., Loud, John D., Mimmack, Gregory J., Slenski, George., Denson, William., Muller, Gunter., Dunbar, William G.
Fformat: eLyfr
Iaith:English
Cyhoeddwyd: New York, N.Y. : McGraw-Hill Education, [2000]
Rhifyn:First edition.
Cyfres:McGraw-Hill's AccessEngineering.
Pynciau:
Electronic apparatus and appliances > Reliability.
System failures (Engineering)
Microelectronics.
Semiconductors.
Acoustic imaging.
Infrared photography.
Electron microscopy.
X-ray microscopy.
Metallography.
Semiconductors > Defects.
Solder and soldering.
Printed circuits.
Electronic apparatus and appliances > Defects.
Electronics > Materials > Defects.
Electronic books.
Mynediad Ar-lein:https://www.accessengineeringlibrary.com/content/book/9780070410442
Tagiau: Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!

Rhyngrwyd

https://www.accessengineeringlibrary.com/content/book/9780070410442

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