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University of Defence
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Neděla V.
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Electron microscopy
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Apertures with Laval Nozzle and Circular Orifice in Secondary Electron Detector for Environmental Scanning Electron Microscope
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Apertures with Laval Nozzle and Circular Orifice in Secondary Electron Detector for Environmental Scanning Electron Microscope
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Analysis of Gas Flow in a Secondary Electron Scintillation Detector for ESEM with a New System of Pressure Limiting Apertures
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Analysis of Gas Flow in a Secondary Electron Scintillation Detector for ESEM with a New System of Pressure Limiting Apertures
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The Impact of Critical Flow on the Primary Electron Beam Passage through Differentially Pumped Chamber
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The Impact of Critical Flow on the Primary Electron Beam Passage through Differentially Pumped Chamber
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Maxa J.
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University of Defence
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